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SEMINAR
Museum Solution Seminar
문화재 보존을 위한 최신 분석 기술 세미나
자이스 코리아 이노베이션 센터(동탄)
곧 시작됩니다!
- 00 년
- 00 개월
- 00 일
- 00 시간
- 00 분
- 00 초
![]({"xsmall":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png/_jcr_content/renditions/original.image_file.100.67.0,20,1056,724.file/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png","small":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png/_jcr_content/renditions/original.image_file.360.240.0,20,1056,724.file/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png","medium":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png/_jcr_content/renditions/original.image_file.768.512.0,20,1056,724.file/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png","large":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png/_jcr_content/renditions/original.image_file.1024.683.0,20,1056,724.file/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png","xlarge":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png/_jcr_content/renditions/original.image_file.1056.704.0,20,1056,724.file/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png","xxlarge":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png/_jcr_content/renditions/original.image_file.1056.704.0,20,1056,724.file/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png","max":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png/_jcr_content/renditions/original.image_file.1056.704.0,20,1056,724.file/%EB%B0%95%EB%AC%BC%EA%B4%80%20%EC%84%B8%EB%AF%B8%EB%82%98_%EC%8B%9C%EA%B0%84%ED%91%9C.png"})
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Museum Solution Seminar
ZEISS와 함께하는 '문화재 보존 최신 분석기술' 세미나에 여러분을 초대합니다.
이번 세미나는 문화재 보존과 복원에 관심있는 전문가분들을 위한 자리로, ZEISS의 최신 기술과 혁신적인 접근 방법을 소개하고자 합니다!
- 일시: 2024년 7월 4일 목요일 오전 10시 - 오후 3시 30분
- 장소: 자이스 코리아 이노베이션 센터(경기도 화성시 동탄기흥로 602)
![]({"xsmall":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/korea_profile_minki.png/_jcr_content/renditions/original.image_file.74.74.0,11,74,85.file/korea_profile_minki.png","small":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/korea_profile_minki.png/_jcr_content/renditions/original.image_file.74.74.0,11,74,85.file/korea_profile_minki.png","medium":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/korea_profile_minki.png/_jcr_content/renditions/original.image_file.74.74.0,11,74,85.file/korea_profile_minki.png","large":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/korea_profile_minki.png/_jcr_content/renditions/original.image_file.74.74.0,11,74,85.file/korea_profile_minki.png","xlarge":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/korea_profile_minki.png/_jcr_content/renditions/original.image_file.74.74.0,11,74,85.file/korea_profile_minki.png","xxlarge":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/korea_profile_minki.png/_jcr_content/renditions/original.image_file.74.74.0,11,74,85.file/korea_profile_minki.png","max":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/korea_profile_minki.png/_jcr_content/renditions/original.image_file.74.74.0,11,74,85.file/korea_profile_minki.png"})
발표자
Minki Choi
ZEISS Korea 현미경 솔루션 사업부
Product Application Sales Specialist
[Session]
- High-Magnification Surface and Structural Details with Electron Microscopy
- Non-invasive Insights Beneath the Surface with X-ray Microscopy
![]({"xsmall":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/kbsi.png/_jcr_content/renditions/original.image_file.100.100.45,0,361,316.file/kbsi.png","small":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/kbsi.png/_jcr_content/renditions/original.image_file.316.316.45,0,361,316.file/kbsi.png","medium":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/kbsi.png/_jcr_content/renditions/original.image_file.316.316.45,0,361,316.file/kbsi.png","large":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/kbsi.png/_jcr_content/renditions/original.image_file.316.316.45,0,361,316.file/kbsi.png","xlarge":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/kbsi.png/_jcr_content/renditions/original.image_file.316.316.45,0,361,316.file/kbsi.png","xxlarge":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/kbsi.png/_jcr_content/renditions/original.image_file.316.316.45,0,361,316.file/kbsi.png","max":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/kbsi.png/_jcr_content/renditions/original.image_file.316.316.45,0,361,316.file/kbsi.png"})
발표자
Dr. Jaeil Park
한국기초과학지원연구원(KBSI)
[Session]
- X-선을 활용한 영상 이미지 연구
![]({"xsmall":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/bruker.png/_jcr_content/renditions/original.image_file.100.100.27,0,284,257.file/bruker.png","small":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/bruker.png/_jcr_content/renditions/original.image_file.257.257.27,0,284,257.file/bruker.png","medium":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/bruker.png/_jcr_content/renditions/original.image_file.257.257.27,0,284,257.file/bruker.png","large":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/bruker.png/_jcr_content/renditions/original.image_file.257.257.27,0,284,257.file/bruker.png","xlarge":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/bruker.png/_jcr_content/renditions/original.image_file.257.257.27,0,284,257.file/bruker.png","xxlarge":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/bruker.png/_jcr_content/renditions/original.image_file.257.257.27,0,284,257.file/bruker.png","max":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/bruker.png/_jcr_content/renditions/original.image_file.257.257.27,0,284,257.file/bruker.png"})
발표자
Mr. Sungji Choi
Bruker Korea
[Session]
- Getting to the Fine Detail with Advanced Elemental Analysis by SEM EDS
![]({"xsmall":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/versa_ZKIC.png/_jcr_content/renditions/original.image_file.100.75.287,0,1514,920.file/versa_ZKIC.png","small":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/versa_ZKIC.png/_jcr_content/renditions/original.image_file.360.270.287,0,1514,920.file/versa_ZKIC.png","medium":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/versa_ZKIC.png/_jcr_content/renditions/original.image_file.768.576.287,0,1514,920.file/versa_ZKIC.png","large":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/versa_ZKIC.png/_jcr_content/renditions/original.image_file.1024.768.287,0,1514,920.file/versa_ZKIC.png","xlarge":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/versa_ZKIC.png/_jcr_content/renditions/original.image_file.1227.920.287,0,1514,920.file/versa_ZKIC.png","xxlarge":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/versa_ZKIC.png/_jcr_content/renditions/original.image_file.1227.920.287,0,1514,920.file/versa_ZKIC.png","max":"https://www.zeiss.co.kr/content/dam/rms/countries/south-korea/versa_ZKIC.png/_jcr_content/renditions/original.image_file.1227.920.287,0,1514,920.file/versa_ZKIC.png"})
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