![광학 좌표 측정기]({"xsmall":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/header.jpg/_jcr_content/renditions/original.image_file.100.33.file/header.jpg","small":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/header.jpg/_jcr_content/renditions/original.image_file.360.120.file/header.jpg","medium":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/header.jpg/_jcr_content/renditions/original.image_file.768.256.file/header.jpg","large":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/header.jpg/_jcr_content/renditions/original.image_file.1024.341.file/header.jpg","xlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/header.jpg/_jcr_content/renditions/original.image_file.1280.427.file/header.jpg","xxlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/header.jpg/_jcr_content/renditions/original.image_file.1440.480.file/header.jpg","max":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/header.jpg/_jcr_content/renditions/original./header.jpg"} "광학 좌표 측정기")
광학 좌표 측정기
유연한 측정 작업을 위한 고정밀 광학 장치
촉각 옵션을 통한 비접촉식 측정
ZEISS 광학 시리즈의 광학 좌표 측정기(VMM)는 고해상도 카메라 시스템, 가변 조명, 정교한 소프트웨어로 빠르고 정확한 측정 결과를 제공합니다. 비접촉식 광학 측정 기술을 통해 광학 제품, 사출 성형품, 호일, 펀칭 및 구부러진 부품과 같이 특히 민감하고 벽이 얇거나 평평한 작업물도 높은 수준의 정밀도로 측정할 수 있습니다. 적용 범위를 넓히기 위해 ZEISS 광학 시리즈 시스템에 추가 프로브를 더하여 단 하나의 CMM으로 고정밀 광학 및 촉각 측정을 수행할 수 있습니다.
![ZEISS O-DETECT]({"xsmall":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original.image_file.100.75.file/zeiss_o_detect_4_3.png","small":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original.image_file.360.270.file/zeiss_o_detect_4_3.png","medium":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original.image_file.768.576.file/zeiss_o_detect_4_3.png","large":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original.image_file.1024.768.file/zeiss_o_detect_4_3.png","xlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original.image_file.1280.960.file/zeiss_o_detect_4_3.png","xxlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original./zeiss_o_detect_4_3.png","max":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original./zeiss_o_detect_4_3.png"} "ZEISS O-DETECT")
![ZEISS O-INSPECT]({"xsmall":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original.image_file.100.75.file/zeiss_o_inspect_4_3.png","small":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original.image_file.360.270.file/zeiss_o_inspect_4_3.png","medium":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original.image_file.768.576.file/zeiss_o_inspect_4_3.png","large":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original.image_file.1024.768.file/zeiss_o_inspect_4_3.png","xlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original.image_file.1280.960.file/zeiss_o_inspect_4_3.png","xxlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original./zeiss_o_inspect_4_3.png","max":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original./zeiss_o_inspect_4_3.png"} "ZEISS O-INSPECT")
![ZEISS O-INSPECT duo]({"xsmall":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.100.75.file/zeiss-o-inspect-duo-perspective-taktil.jpg","small":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.360.270.file/zeiss-o-inspect-duo-perspective-taktil.jpg","medium":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.768.576.file/zeiss-o-inspect-duo-perspective-taktil.jpg","large":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.1024.768.file/zeiss-o-inspect-duo-perspective-taktil.jpg","xlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.1280.960.file/zeiss-o-inspect-duo-perspective-taktil.jpg","xxlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.1440.1080.file/zeiss-o-inspect-duo-perspective-taktil.jpg","max":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original./zeiss-o-inspect-duo-perspective-taktil.jpg"} "ZEISS O-INSPECT duo")
![멀티 센서 기술]({"xsmall":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/multisensor.jpg/_jcr_content/renditions/original.image_file.100.75.0,221,1280,1181.file/multisensor.jpg","small":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/multisensor.jpg/_jcr_content/renditions/original.image_file.360.270.0,221,1280,1181.file/multisensor.jpg","medium":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/multisensor.jpg/_jcr_content/renditions/original.image_file.768.576.0,221,1280,1181.file/multisensor.jpg","large":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/multisensor.jpg/_jcr_content/renditions/original.image_file.1024.768.0,221,1280,1181.file/multisensor.jpg","xlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/multisensor.jpg/_jcr_content/renditions/original.image_file.1280.960.0,221,1280,1181.file/multisensor.jpg","xxlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/multisensor.jpg/_jcr_content/renditions/original.image_file.1280.960.0,221,1280,1181.file/multisensor.jpg","max":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/multisensor.jpg/_jcr_content/renditions/original.image_file.1280.960.0,221,1280,1181.file/multisensor.jpg"} "멀티 센서 기술")
멀티 센서 기술
광학 및 촉각 측정 기술 결합
광학 시리즈의 모든 제품은 촉각 센서와 호환되므로 고정밀 2D 광학 측정 외에도 3D 촉각 측정 결과를 수집할 수 있습니다. 모델에 따라 촉각 프로브 헤드는 옵션으로 제공되거나 기본 패키지에 포함되어 있습니다.
![다양한 요구 사항에 맞는 다양한 크기]({"xsmall":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/groessen.jpg/_jcr_content/renditions/original.image_file.100.56.0,280,1280,1000.file/groessen.jpg","small":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/groessen.jpg/_jcr_content/renditions/original.image_file.360.203.0,280,1280,1000.file/groessen.jpg","medium":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/groessen.jpg/_jcr_content/renditions/original.image_file.768.432.0,280,1280,1000.file/groessen.jpg","large":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/groessen.jpg/_jcr_content/renditions/original.image_file.1024.576.0,280,1280,1000.file/groessen.jpg","xlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/groessen.jpg/_jcr_content/renditions/original.image_file.1280.720.0,280,1280,1000.file/groessen.jpg","xxlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/groessen.jpg/_jcr_content/renditions/original.image_file.1280.720.0,280,1280,1000.file/groessen.jpg","max":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/groessen.jpg/_jcr_content/renditions/original.image_file.1280.720.0,280,1280,1000.file/groessen.jpg"} "다양한 요구 사항에 맞는 다양한 크기")
다양한 크기
다양한 요구 사항에 맞는 다양한 크기
ZEISS O-DETECT 및 ZEISS O-INSPECT는 다양한 크기로 제공되며 작고 섬세한 부품부터 대형 작업물까지 다양한 용도에 적합합니다.
기술 비교
![ZEISS O-DETECT]({"xsmall":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original.image_file.100.100.142,6,1219,1083.file/zeiss_o_detect_4_3.png","small":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original.image_file.360.360.142,6,1219,1083.file/zeiss_o_detect_4_3.png","medium":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original.image_file.768.768.142,6,1219,1083.file/zeiss_o_detect_4_3.png","large":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original.image_file.1024.1024.142,6,1219,1083.file/zeiss_o_detect_4_3.png","xlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original.image_file.1077.1077.142,6,1219,1083.file/zeiss_o_detect_4_3.png","xxlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original.image_file.1077.1077.142,6,1219,1083.file/zeiss_o_detect_4_3.png","max":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_detect_4_3.png/_jcr_content/renditions/original.image_file.1077.1077.142,6,1219,1083.file/zeiss_o_detect_4_3.png"} "ZEISS O-DETECT")
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![ZEISS O-INSPECT]({"xsmall":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original.image_file.100.100.185,0,1268,1083.file/zeiss_o_inspect_4_3.png","small":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original.image_file.360.360.185,0,1268,1083.file/zeiss_o_inspect_4_3.png","medium":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original.image_file.768.768.185,0,1268,1083.file/zeiss_o_inspect_4_3.png","large":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original.image_file.1024.1024.185,0,1268,1083.file/zeiss_o_inspect_4_3.png","xlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original.image_file.1083.1083.185,0,1268,1083.file/zeiss_o_inspect_4_3.png","xxlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original.image_file.1083.1083.185,0,1268,1083.file/zeiss_o_inspect_4_3.png","max":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss_o_inspect_4_3.png/_jcr_content/renditions/original.image_file.1083.1083.185,0,1268,1083.file/zeiss_o_inspect_4_3.png"} "ZEISS O-INSPECT")
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![ZEISS O-INSPECT duo]({"xsmall":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.100.100.296,5,1619,1328.file/zeiss-o-inspect-duo-perspective-taktil.jpg","small":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.360.360.296,5,1619,1328.file/zeiss-o-inspect-duo-perspective-taktil.jpg","medium":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.768.768.296,5,1619,1328.file/zeiss-o-inspect-duo-perspective-taktil.jpg","large":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.1024.1024.296,5,1619,1328.file/zeiss-o-inspect-duo-perspective-taktil.jpg","xlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.1280.1280.296,5,1619,1328.file/zeiss-o-inspect-duo-perspective-taktil.jpg","xxlarge":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.1323.1323.296,5,1619,1328.file/zeiss-o-inspect-duo-perspective-taktil.jpg","max":"https://www.zeiss.co.kr/content/dam/iqs/r/systems/cmm/optical-measurement/zeiss-o-inspect-duo-perspective-taktil.jpg/_jcr_content/renditions/original.image_file.1323.1323.296,5,1619,1328.file/zeiss-o-inspect-duo-perspective-taktil.jpg"} "ZEISS O-INSPECT duo")
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제품 유형 |
좌표 측정기 |
좌표 측정기 |
현미경 및 좌표 측정기 |
|
측정 범위(dm) |
3/2/2; 5/4/3 |
3/2/2; 5/4/3; 8/6/3 |
8/6/3 |
|
광학 프로브 |
ZEISS INVENTA D1 |
ZEISS Discovery.V12 |
ZEISS Discovery.V12 |
|
카메라 |
5 MP 블랙/화이트 |
표준 100 또는 스카우트 160 또는 스카우트 240 |
스카우트 160 c |
|
광학 배율 |
1.0x |
최대 12배 |
최대 12배 |
|
기타 프로브 |
ZEISS XDT(옵션) |
ZEISS VAST XXT |
ZEISS VAST XXT |
|
개요 카메라 |
예 |
아니요 |
아니요 |
|
조명 |
파란색 및 흰색 LED, 동축 입사광 및 백라이트, 확산 링 조명(옵션)이 포함된 8 세그먼트 LED 링 조명(옵션) |
빨간색 및 파란색 LED, 동축 입사광 및 백라이트가 포함된 8 세그먼트 LED 링 조명 |
흰색 LED, 동축 입사광 및 백라이트가 포함된 16 세그먼트 LED 링 조명 |
|
정확도 |
1D: 1.6 μm + L/200 μm |
1D: 1.4 μm + L/250 μm |
1D: 1.5 µm + L/250 µm (8/6/3) |
|
소프트웨어 |
ZEISS CALYPSO |
ZEISS CALYPSO |
ZEISS CALYPSO |